The M2 offers high-speed microelectronic device inspection with exceptional defect coverage. With resolutions down to submircon levels and telecentric optics, the M2 provides complete inspection, all within a footprint less than 1 sq. meter.
Automated Optical Inspection for Microelectronics
  • Megapixel color imaging
  • High magnification
  • top-down viewing camera
  • Quick set-up
  • High speed
  • High defect coverage
  • Low false failure rate